Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs

نویسندگان

  • S. Zangooie
  • Mathias Schubert
  • Daniel W. Thompson
  • J. A. Woollam
چکیده

Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs" (2001).

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Free-carrier absorption in Be- and C-doped GaAs epilayers and far infrared detector applications

Far infrared ~FIR! absorption, reflection, and transmission in heavily doped p-GaAs multilayer structures have been measured for wavelengths 20–200 mm and compared with the calculated results. Both Be ~in the range 3310– 2.6310 cm! and C (1.8310– 4.7310 cm)-doped structures were studied. It is found that the observed absorption, reflection, and transmission are explained correctly by the model ...

متن کامل

Optical characterizations of heavily doped p-type AlxGa1−xAs and GaAs epitaxial films at terahertz frequencies

The optical properties of p-type AlxGa1−xAs sx=0, 0.01, and 0.16d epitaxial films with different beryllium and carbon doping concentrations s1018–1019 cm−3d were investigated by far-infrared reflectance spectroscopy in the 1.5–15-THz frequency range. The dielectric response functions of the film samples were expressed using the classical Lorentz–Drude model. Optical properties were obtained usi...

متن کامل

Homojunction internal photoemission far-infrared detectors: Photoresponse performance analysis

The concept of homojunction infernal photoemission far-infrared (FIR) detectors has been successfully demonstrated using forward biased Si p-i-n diodes at 4.2 K. The basic structure consists of a heavily doped IR absorber layer and an intrinsic (or lightly doped) layer. An interfacial workfunction between these regions defines the long-wavelength cutoff (X,) of the detector. Three types of dete...

متن کامل

Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-type GaAs.

We report for the first time on the application of generalized ellipsometry at far-infrared wavelengths (wave numbers from 150 cm(-1) to 600 cm(-1)) for measurement of the anisotropic dielectric response of doped polar semiconductors in layered structures within an external magnetic field. Upon determination of normalized Mueller matrix elements and subsequent derivation of the normalized compl...

متن کامل

Ultra-doped n-type germanium thin films for sensing in the mid-infrared

A key milestone for the next generation of high-performance multifunctional microelectronic devices is the monolithic integration of high-mobility materials with Si technology. The use of Ge instead of Si as a basic material in nanoelectronics would need homogeneous p- and n-type doping with high carrier densities. Here we use ion implantation followed by rear side flash-lamp annealing (r-FLA) ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2013